Nikon Eclipse Me600 Manual
2021年12月5日Download here: http://gg.gg/x556w
This Nikon E600 Fluorescence microscope is complete and ready to use with DAPI, FITC, and TRITC fluorescence filters. The microscope comes with trinocular head, 10x eyepieces, and Plan Fluor 4x, 10x, 20x, 40x, 100x objectives. Nikon Eclipse ME600 Inspection Microscope - Let Spectra Services configure this Nikon ME600 to your exact needs Check out the deal on Nikon Eclipse ME600 Inspection Microscope at spectraservices.com Product Search.
*Nikon Eclipse Me600 Manual User
*Nikon Eclipse Me600 Manual Software
*Nikon Eclipse Me600 Manual User
*Nikon Eclipse Me600 Manual TransmissionNikon Eclipse Me600 Manual UserWebsite:www.suss.comContact person:Marco AsaLocation:Back-EndDescription: The SUSS PM5 is a probing station for electrical (DC and HF) measurements on wafers, chips and substrates up to 150 mm. It has four SUSS ProbeHeads placed on the stable platen, with space for additional probes if necessary. The platen height can be adjusted up to 40 mm allowing a quick and easy setup of the system. The additional contact separation of 200 μm ensures accurate fine adjustment of the probe platen. The 4 ProbeHeads (X, Y, Z movements) are connected to the platen by vacuum. They can be equipped with tungsten needles, with radius down to 2µm. A metal bridge, which spans the width of the probe system and is fastened to the base, support the microscope. This is equipped with ExtraLongWorkingDistance 2x, 10x, 20x objectives and 10x ocular. It has a third ocular for camera imaging (not installed). The chuck stage can be X, Y and Z moved and can be heated/cooled. All knobs are located to allow easy and precise movement of the chuck stage with just one hand. The X and Y axes can be adjusted independently. Once it has reached the test position, the stage locks into place and provides additional fine adjustment in the Z direction. A pull-out stage permits quick and ergonomic loading and unloading of your DUT. Working principleNikon Eclipse Me600 Manual Software First place the DUT on the chuck and activate the vacuum for a tight fixing. Switch-on the light for the microscope. Operate X,Y,Z movements of the chuck, of the platen and of the ProbeHead to contact the needles to the DUT pads. The needles are in electrical contact with the ProbeHead arm and to the BNC cables for electrical measurements with external electronic instrumentation. Up to 4 contact points can be operated independently at the same time thanks to the 4 ProbeHaeds. Remember to switch-off microscope light when measuring. Specifications
SÜSS MicroTec Manual Electric Probe System PM5 specificationsWebsite:www.nikoninstruments.com/Contact person:Lorenzo LiviettiLocation:Back-endDescription: Nikon Eclipse ME600 is optical microscope equipped with three objectives (20x, 50x and 100x) and an incident (epi) illumination system. The microscope can be used in differential interference contrast (DIC) imaging, which is an imaging method based on the contrast difference of the samples, and in dark field (DF) mode. With DIC and DF, it is possible to see details from optically transparent samples that are invisible in the ordinary microscope images. Working principleDifferential Interference Contrast (DIC) This method, an extension of polarization contrast, is suitable for the visualization of even minute differences in height on surfaces. A birefringent prism (4) is used which splits the polarized light beam into two partial beams on its way to the sample. These two partial beams strike the sample (6) with lateral displacement from each other. If the surface is completely flat, nothing will happen. However, if there is a small step between the partial rays, one of the two beams has to travel along a path which is 2Δh longer. Once the partial beams have returned via DIC prism (4) and analyzer (7), they display the same direction of vibration again and can interfere with each other in the intermediate image. The path difference experienced on the surface then changes into grey values which can be seen by the eye: steps become visible in the form of relief. As an auxiliary object, the lambda-plate (7a) finally changes the grey values into colors again. Dark Field (DF)Nikon Eclipse Me600 Manual User The light is emanating from the illumination lamp and collimated by the Collector. Most of the light is then blocked by the Condenser-aperture-diaphragm, which has a central stop that blocks the central rays of the beam. The light is then reflected by a 45° mirror with a circular hole in the center. In this way the light travels towards the sample on the outside of the actual objective lens. It is then focused on the sample by an inner mirror at the end of the objective housing. Light is deflected by any unevenness on the sample surface, and part of it is passed back via the objective lens to the eye of the operator. In this way, no directly (specularly) reflected light is seen by the operator (i.e. a perfectly clean mirror surface appears black). Only height differences, given by the dust and edges, on the surface are seen in the image. Nikon Eclipse Me600 Manual Transmission
Bright field (left) and dark field (right) images of a test sample. In DF only the edges are visible.
Download here: http://gg.gg/x556w
https://diarynote.indered.space
This Nikon E600 Fluorescence microscope is complete and ready to use with DAPI, FITC, and TRITC fluorescence filters. The microscope comes with trinocular head, 10x eyepieces, and Plan Fluor 4x, 10x, 20x, 40x, 100x objectives. Nikon Eclipse ME600 Inspection Microscope - Let Spectra Services configure this Nikon ME600 to your exact needs Check out the deal on Nikon Eclipse ME600 Inspection Microscope at spectraservices.com Product Search.
*Nikon Eclipse Me600 Manual User
*Nikon Eclipse Me600 Manual Software
*Nikon Eclipse Me600 Manual User
*Nikon Eclipse Me600 Manual TransmissionNikon Eclipse Me600 Manual UserWebsite:www.suss.comContact person:Marco AsaLocation:Back-EndDescription: The SUSS PM5 is a probing station for electrical (DC and HF) measurements on wafers, chips and substrates up to 150 mm. It has four SUSS ProbeHeads placed on the stable platen, with space for additional probes if necessary. The platen height can be adjusted up to 40 mm allowing a quick and easy setup of the system. The additional contact separation of 200 μm ensures accurate fine adjustment of the probe platen. The 4 ProbeHeads (X, Y, Z movements) are connected to the platen by vacuum. They can be equipped with tungsten needles, with radius down to 2µm. A metal bridge, which spans the width of the probe system and is fastened to the base, support the microscope. This is equipped with ExtraLongWorkingDistance 2x, 10x, 20x objectives and 10x ocular. It has a third ocular for camera imaging (not installed). The chuck stage can be X, Y and Z moved and can be heated/cooled. All knobs are located to allow easy and precise movement of the chuck stage with just one hand. The X and Y axes can be adjusted independently. Once it has reached the test position, the stage locks into place and provides additional fine adjustment in the Z direction. A pull-out stage permits quick and ergonomic loading and unloading of your DUT. Working principleNikon Eclipse Me600 Manual Software First place the DUT on the chuck and activate the vacuum for a tight fixing. Switch-on the light for the microscope. Operate X,Y,Z movements of the chuck, of the platen and of the ProbeHead to contact the needles to the DUT pads. The needles are in electrical contact with the ProbeHead arm and to the BNC cables for electrical measurements with external electronic instrumentation. Up to 4 contact points can be operated independently at the same time thanks to the 4 ProbeHaeds. Remember to switch-off microscope light when measuring. Specifications
SÜSS MicroTec Manual Electric Probe System PM5 specificationsWebsite:www.nikoninstruments.com/Contact person:Lorenzo LiviettiLocation:Back-endDescription: Nikon Eclipse ME600 is optical microscope equipped with three objectives (20x, 50x and 100x) and an incident (epi) illumination system. The microscope can be used in differential interference contrast (DIC) imaging, which is an imaging method based on the contrast difference of the samples, and in dark field (DF) mode. With DIC and DF, it is possible to see details from optically transparent samples that are invisible in the ordinary microscope images. Working principleDifferential Interference Contrast (DIC) This method, an extension of polarization contrast, is suitable for the visualization of even minute differences in height on surfaces. A birefringent prism (4) is used which splits the polarized light beam into two partial beams on its way to the sample. These two partial beams strike the sample (6) with lateral displacement from each other. If the surface is completely flat, nothing will happen. However, if there is a small step between the partial rays, one of the two beams has to travel along a path which is 2Δh longer. Once the partial beams have returned via DIC prism (4) and analyzer (7), they display the same direction of vibration again and can interfere with each other in the intermediate image. The path difference experienced on the surface then changes into grey values which can be seen by the eye: steps become visible in the form of relief. As an auxiliary object, the lambda-plate (7a) finally changes the grey values into colors again. Dark Field (DF)Nikon Eclipse Me600 Manual User The light is emanating from the illumination lamp and collimated by the Collector. Most of the light is then blocked by the Condenser-aperture-diaphragm, which has a central stop that blocks the central rays of the beam. The light is then reflected by a 45° mirror with a circular hole in the center. In this way the light travels towards the sample on the outside of the actual objective lens. It is then focused on the sample by an inner mirror at the end of the objective housing. Light is deflected by any unevenness on the sample surface, and part of it is passed back via the objective lens to the eye of the operator. In this way, no directly (specularly) reflected light is seen by the operator (i.e. a perfectly clean mirror surface appears black). Only height differences, given by the dust and edges, on the surface are seen in the image. Nikon Eclipse Me600 Manual Transmission
Bright field (left) and dark field (right) images of a test sample. In DF only the edges are visible.
Download here: http://gg.gg/x556w
https://diarynote.indered.space
コメント